Report date: Apr 23, 2024
Conflict count: 350216
Publisher: Institute of Electrical and Electronics Engineers
Title count: 18
Conflict count: 84


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Created: 2024-04-18 13:21:39.0
ConfID: 7277635
CauseID: 1624796701
OtherID: 1624796709
JT: IEEE Transactions on Nuclear Science
MD: null, 71 ,4,3,2024,IEEE Transactions on Nuclear Science information for authors
DOI: 10.1109/TNS.2024.3384819(Journal) (7277635-N )
DOI: 10.1109/TNS.2024.3384898(Journal)
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Created: 2024-04-18 13:21:40.0
ConfID: 7277636
CauseID: 1624796709
OtherID: 1624796701
JT: IEEE Transactions on Nuclear Science
MD: null, 71 ,4,2,2024,IEEE Transactions on Nuclear Science publication information
DOI: 10.1109/TNS.2024.3384897(Journal) (7277636-N )
DOI: 10.1109/TNS.2024.3384720(Journal)
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Created: 2024-04-18 13:21:40.0
ConfID: 7277637
CauseID: 1624796709
OtherID: 1624796701
JT: IEEE Transactions on Nuclear Science
MD: null, 71 ,4,4,2024,Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society
DOI: 10.1109/TNS.2024.3384886(Journal) (7277637-N )
DOI: 10.1109/TNS.2024.3384820(Journal)