Nanostructured Materials - Scientific Background and Technological Perspectives
p.67
p.67
Segregation to Boundaries and Interfaces in Solids
p.81
p.81
Surface/Interface X-Ray Diffraction
p.95
p.95
Characterisation of the Mechanical Properties of Thin Film Cantilevers with the Atomic Force Microscope
p.107
p.107
Comparison of STEM and Atom Probe Methods for Chemical Analysis of Grain Boundaries in Commercial Al Alloys
p.115
p.115
Interfacial Structure of a Σ9 and Defect Structure at Junctions of Σ3-Σ9-Σ3 in Diamond Film
p.121
p.121
Grain Boundary Structure in Titanium Diboride
p.129
p.129
HRTEM Study of Atomic Faceting Interfaces of Σ=3 NiSi2/Si on (011) Si Substrate
p.135
p.135
Grain Boundaries of Finit Lenght
p.143
p.143
Comparison of STEM and Atom Probe Methods for Chemical Analysis of Grain Boundaries in Commercial Al Alloys
Abstract:
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Info:
Periodical:
Materials Science Forum (Volumes 189-190)
Pages:
115-120
Citation:
Online since:
July 1995
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