Elsevier

Surface Science

Volume 184, Issue 3, 1 June 1987, Pages L439-L444
Surface Science

Composition depth profiles of PtRh alloys in surface segregation, and cosegregation with sulfur impurities

https://doi.org/10.1016/S0039-6028(87)80357-6Get rights and content

Composition depth profiles with true atomic layer resolution have been obtained with the atom-probe for the (111) and (001) planes of PtRh alloys. The first surface layer is enriched with Pt and the second layer is enriched with Rh. The enrichment is slightly pronounced at plane edges. No reversed segregation is observed at the dilute Rh side of the alloy composition. A reversed segregation is observed if the samples contain a small amount of sulfur.

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