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Electron probeX-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level

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Abstract

A new approach to the assessment of homogeneity for powder samples of candidate reference materials with the help of electron probeX-ray micro-analysis (EPMA) is proposed. It is based on the utilisation of the Kolmogorov—Smirnov statistics coupled with the Akaike Information Criterion in the processing of the quantitative EPMA data. The evaluation of three IAEA candidate reference materials with the described approach is discussed.

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Author notes

  1. Vlado Valkovic

    Present address: A. & c.T., Prilesje 4, 10000, Zagreb, Croatia

Authors and Affiliations

  1. Micro- and Trace Analysis Centre (MiTAC), Department of Chemistry, University of Antwerpen (UIA), Universiteitsplein 1, B-2610, Antwerpen, Belgium

    Stefaan Hoornaert, Boris Treiger, Vlado Valkovic & René Van Grieken

  2. IAEA Laboratories, A-2444, Seibersdorf, Austria

    Vlado Valkovic

Authors
  1. Stefaan Hoornaert
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  2. Boris Treiger
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  3. Vlado Valkovic
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  4. René Van Grieken
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Hoornaert, S., Treiger, B., Valkovic, V. et al. Electron probeX-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level. Mikrochim Acta 128, 207–213 (1998). https://doi.org/10.1007/BF01243051

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  • DOI: https://doi.org/10.1007/BF01243051

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