Hole states in nanocups in a magnetic field

N. Čukarić, V. Arsoski, M. Tadić, and F. M. Peeters
Phys. Rev. B 85, 235425 – Published 12 June 2012

Abstract

The magnetic-field dependence of the hole states in a nanocup, which is composed of a ring (the nanocup rim) that surrounds a disk (the nanocup bottom), is obtained within the Luttinger-Kohn model for the unstrained GaAs/(Al,Ga)As and the strained (In,Ga)As/GaAs systems. Aharonov-Bohm oscillations due to angular momentum transitions of the hole ground state appear with periods that vary with the thickness of the disk. The strain in the (In,Ga)As/GaAs nanocup is sensitive to the disk thickness and favors the spatial localization of the heavy holes inside the disk. Therefore, the angular momentum transitions between the valence-band states disappear for much thinner disks than in the case of the unstrained GaAs/(Al,Ga)As nanocups. In both systems, the oscillations in the energy of the hole ground state are found to disappear for thinner inner layer than in the electron ground-state energy. This is due to the different confining potentials and the mixing between the heavy- and light-hole states. As a consequence, magnetization of the single hole is found to strongly depend on the bottom thickness of the strained (In,Ga)As/GaAs nanocup. Furthermore, we found that the strain can lead to a spatial separation of the electron and the hole, as in type-II band alignment, which is advantageous for the appearance of the excitonic Aharonov-Bohm effect.

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  • Received 12 August 2011

DOI:https://doi.org/10.1103/PhysRevB.85.235425

©2012 American Physical Society

Authors & Affiliations

N. Čukarić1,2,*, V. Arsoski1,†, M. Tadić1,‡, and F. M. Peeters2,§

  • 1School of Electrical Engineering, University of Belgrade, P.O. Box 35-54, 11120 Belgrade, Serbia
  • 2Department of Physics, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium

  • *nemanja.cukaric@etf.bg.ac.rs
  • vladimir.arsoski@etf.bg.ac.rs
  • milan.tadic@etf.bg.ac.rs
  • §francois.peeters@ua.ac.be

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Issue

Vol. 85, Iss. 23 — 15 June 2012

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