Issue 4, 2003
From the journal:

Journal of Analytical Atomic Spectrometry

Micro-heterogeneity study of trace elements in USGS, MPI-DING and NIST glass reference materials by means of synchrotron micro-XRF

L. Kempenaers,a   K. Janssens,*a   K. P. Jochum,b   L. Vincze,a   B. Vekemans,a   A. Somogyi,a   M. Drakopoulosc  and  F. Adamsa  

* Corresponding authors

a Department of Chemistry, University of Antwerp, Universiteitsplein 1, B-2610 Antwerp, Belgium

b Max-Planck-Institut für Chemie, Postfach 3060, D-55020 Mainz, Germany

c European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble, Cedex, France

Abstract

Synchrotron μ-XRF (X-ray fluorescence analysis), a trace level micro analytical method, allows the quantitative study of the nature and degree of heterogeneity of inorganic trace constituents in reference materials with a homogeneous matrix. In the present study, glass materials of NIST, MPI-DING and USGS containing trace levels of heavy metals are considered. The measurements involve an extensive series of local analyses, performed in identical conditions at different locations on the material. This procedure is employed to measure the degree of micro-heterogeneity of several existing reference materials and to evaluate their suitability for calibration of trace-level micro-analytical methods. For a number of the trace elements present in the various reference materials, a minimum representative mass for homogeneous measurements is calculated.

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Article information

DOI
https://doi.org/10.1039/B212196D
Article type
Paper
Submitted
12 Dec 2002
Accepted
19 Feb 2003
First published
10 Mar 2003

J. Anal. At. Spectrom., 2003,18, 350-357

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Micro-heterogeneity study of trace elements in USGS, MPI-DING and NIST glass reference materials by means of synchrotron micro-XRF

L. Kempenaers, K. Janssens, K. P. Jochum, L. Vincze, B. Vekemans, A. Somogyi, M. Drakopoulos and F. Adams, J. Anal. At. Spectrom., 2003, 18, 350 DOI: 10.1039/B212196D

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