Molecular collapse in graphene: Sublattice symmetry effect

Jing Wang, Miša Anđelković, Gaofeng Wang, and Francois M. Peeters
Phys. Rev. B 102, 064108 – Published 25 August 2020

Abstract

Atomic collapse can be observed in graphene because of its large “effective” fine structure constant, which enables this phenomenon to occur for an impurity charge as low as Zc12. Here we investigate the effect of the sublattice symmetry on molecular collapse in two spatially separated charge tunable vacancies, which are located on the same (A-A type) or different (A-B type) sublattices. We find that the broken sublattice symmetry: (1) does not affect the location of the main bonding and antibonding molecular collapse peaks, (2) but shifts the position of the satellite peaks, because they are a consequence of the breaking of the local sublattice symmetry, and (3) there are vacancy characteristic collapse peaks that only occur for A-B type vacancies, which can be employed to distinguish them experimentally from the A-A type. As the charge, energy, and separation distance increase, the additional collapse features merge with the main molecular collapse peaks. We show that the spatial distribution around the vacancy site of the collapse states allows us to differentiate the molecular from the frustrated collapse.

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  • Received 4 June 2020
  • Accepted 12 August 2020

DOI:https://doi.org/10.1103/PhysRevB.102.064108

©2020 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Jing Wang*

  • School of Electronics and Information, Hangzhou Dianzi University, Hangzhou, Zhejiang Province 310018, China; Departement Fysica, Universiteit Antwerpen, Groenenborgerlaan 171, B-2020 Antwerpen, Belgium; and NANOlab Center of Excellence, University of Antwerp, Belgium

Miša Anđelković

  • Departement Fysica, Universiteit Antwerpen, Groenenborgerlaan 171, B-2020 Antwerpen, Belgium and NANOlab Center of Excellence, University of Antwerp, Belgium

Gaofeng Wang

  • School of Electronics and Information, Hangzhou Dianzi University, Hangzhou, Zhejiang Province, China

Francois M. Peeters

  • Departement Fysica, Universiteit Antwerpen, Groenenborgerlaan 171, B-2020 Antwerpen, Belgium and NANOlab Center of Excellence, University of Antwerp, Belgium

  • *wangjing@hdu.edu.cn
  • gaofeng@hdu.edu.cn
  • francois.peeters@uantwerpen.be

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Issue

Vol. 102, Iss. 6 — 1 August 2020

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