Hostname: page-component-848d4c4894-75dct Total loading time: 0 Render date: 2024-05-20T12:47:02.784Z Has data issue: false hasContentIssue false

Optics for X-ray Microfluorescence to Be Used at the European Synchrotron Radiation Facility

Published online by Cambridge University Press:  06 March 2019

L. Vincze
Affiliation:
Department of Chemistry University of Antwerp (U.I.A.) Universiteitsplein 1, B-2610 Antwerp, Belgium
K. Janssens
Affiliation:
Department of Chemistry University of Antwerp (U.I.A.) Universiteitsplein 1, B-2610 Antwerp, Belgium
F. Adams
Affiliation:
Department of Chemistry University of Antwerp (U.I.A.) Universiteitsplein 1, B-2610 Antwerp, Belgium
Get access

Extract

Micro-SRXRF (Synchrotron Radiation induced X-ray Fluorescence) is ti microanalytical technique which, utilizes an intense, polarized X-ray micro beam originating from the storage ring to induce X-ray fluorescence in a microscopic volume of the sample under investigation. The emerging fluorescent and scattered radiation is normally detected by an energy-dispersive Si(Li) detector. The recorded fluorescent spectra provide qualitative and quantitative information on the examined material yielding minimum, detection limits in the ppm and in favourable cases in the sub-ppm range at current SRXRF-facilities. Possible applications of synchrotron X-ray microprobes are the mapping of chemical elements in biological tissues, investigation of element migration and partitioning in geological systems, the analysis of individual microscopic particles and a variety of topics in applied research.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[Al] James, R. W.: The Optical Principles of the Diffraction of X-rays (Cornell University Press, Ithaca, N.Y., 1967).Google Scholar
[A2] Born, M. and Wolf, E.: Principles of Optics (Pergamon Press, London, 1975).Google Scholar
[A3] Vineyard, G. H.: Phys. Rev. B, 26, 4146, (1982).Google Scholar
[A4] McMaster, W.H., Kerr, N. Del Grande, J.M. Mallett and Hubbel, J.M., “Compilation of X-Ray Cross Sections, Rep. UCRL-50174, Sect. II, Rev. 1 (Lawrence Radiation Laboratory, Livermore, CA), (1969).Google Scholar
[AS] Henke, B.L., Lee, P., Tanaka, T.J., R., Shimabukuro and Fujikawa, B.K., At. Data & Nucl. Data Tables 27. 1., (1982).Google Scholar