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Quantitative characterization of individual particle surfaces by fractal analysis of scanning electron microscope images

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Abstract

Morphological characterization of individual particle surfaces was explored by off-line image processing of data obtained by scanning electron microscope — microanalyzer. The fractal geometry was studied by two methods, the power spectrum and the variogram approach. Both methods were evaluated, theoretically by a series of numerically simulated surface profiles and experimentally on a set of pre-recorded secondary electron images of particle surfaces exposing characteristic textures. It was shown that the fractal approach could stand as a base of the methods enlarging the application of electron probe X-ray microanalyzers for individual particle characterization.

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Author information

Author notes

  1. Akos Vertes

    Present address: Department of Chemistry, George Washington University, 20052, Washington, DC, USA

Authors and Affiliations

  1. Department of Chemistry, University of Antwerp (UIA), B-2610, Antwerp-Wilrijk, Belgium

    Annick Van Put, Akos Vertes, Boris Treiger & René Van Grieken

  2. Institute of Physics and Nuclear Techniques, Academy of Mining and Metallurgy, PL-30059, Krakow, Poland

    Akos Vertes, Darek Wegrzynek & Boris Treiger

Authors
  1. Annick Van Put
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  2. Akos Vertes
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  3. Darek Wegrzynek
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  4. Boris Treiger
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  5. René Van Grieken
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Additional information

Dedicated to Professor Dr. Dieter Klockow on the occasion of his 60th birthday

On leave from: State Pedagogical Institute, Kirovograd, Ukraine

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Van Put, A., Vertes, A., Wegrzynek, D. et al. Quantitative characterization of individual particle surfaces by fractal analysis of scanning electron microscope images. Fresenius J Anal Chem 350, 440–447 (1994). https://doi.org/10.1007/BF00321787

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  • DOI: https://doi.org/10.1007/BF00321787

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