Comptes Rendus
no. 2-3
Electron microscopy / Microscopie électronique
Shaping electron beams for the generation of innovative measurements in the (S)TEM
[Réaliser des mesures originales et innovantes en adaptant le faisceau d'électrons d'un (S)TEM]
Jo Verbeeck1  ; Giulio Guzzinati1  ; Laura Clark1  ; Roeland Juchtmans1  ; Ruben Van Boxem1  ; He Tian1  ; Armand Béché1  ; Axel Lubk1, 2  ; Gustaaf Van Tendeloo1
1 EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium
2 Triebenberglabor, University of Dresden, Zum Triebenberg 1, 01062 Dresden, Germany
Comptes Rendus. Physique, Volume 15 (2014) no. 2-3, pp. 190-199.

Dans un microscope électronique à transmission, l'objectif le plus courant est de focaliser le plus finement possible la sonde d'électrons primaires dans le plan de l'échantillon, afin d'obtenir la meilleure résolution spatiale en STEM (Scanning Transmission Electron Microscopy). Dans ce but, l'utilisation d'un correcteur de Cs sonde est particulièrement importante pour s'approcher d'une onde sphérique idéale. Dans cet article, nous discuterons des avantages que peuvent présenter les modifications spécifiques de cette phase pour créer des sondes d'électrons totalement différentes, ouvrant le champ à des applications originales en STEM. Nous insisterons, en particulier, sur les sondes d'électrons de type « vortex », une famille d'ondes possédant une signature azimutale de phase, dont nous décrirons l'obtention, les propriétés et différentes utilisations. Ces concepts très généraux peuvent être étendus à différents types de sondes, alors optimisées pour une mesure ou une intéraction particulière.

In TEM, a typical goal consists of making a small electron probe in the sample plane in order to obtain high spatial resolution in scanning transmission electron microscopy. In order to do so, the phase of the electron wave is corrected to resemble a spherical wave compensating for aberrations in the magnetic lenses. In this contribution, we discuss the advantage of changing the phase of an electron wave in a specific way in order to obtain fundamentally different electron probes opening up new applications in the (S)TEM. We focus on electron vortex states as a specific family of waves with an azimuthal phase signature and discuss their properties, production and applications. The concepts presented here are rather general and also different classes of probes can be obtained in a similar fashion, showing that electron probes can be tuned to optimize a specific measurement or interaction.

Publié le :
DOI : 10.1016/j.crhy.2013.09.014
Keywords: Vortex beam, Transmission Electron Microscopy, Angular momentum, Topological Charge, Nanomanipulation, Magnetic properties
Mot clés : Vortex, Microscopie électronique en transmission, Moment angulaire, Charge topologique, Nanomanipulation, Propriétés magnétiques
Jo Verbeeck 1 ; Giulio Guzzinati 1 ; Laura Clark 1 ; Roeland Juchtmans 1 ; Ruben Van Boxem 1 ; He Tian 1 ; Armand Béché 1 ; Axel Lubk 1, 2 ; Gustaaf Van Tendeloo 1

1 EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium
2 Triebenberglabor, University of Dresden, Zum Triebenberg 1, 01062 Dresden, Germany 
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     title = {Shaping electron beams for the generation of innovative measurements in the {(S)TEM}},
     journal = {Comptes Rendus. Physique},
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Jo Verbeeck; Giulio Guzzinati; Laura Clark; Roeland Juchtmans; Ruben Van Boxem; He Tian; Armand Béché; Axel Lubk; Gustaaf Van Tendeloo. Shaping electron beams for the generation of innovative measurements in the (S)TEM. Comptes Rendus. Physique, Volume 15 (2014) no. 2-3, pp. 190-199. doi : 10.1016/j.crhy.2013.09.014. https://comptes-rendus.academie-sciences.fr/physique/articles/10.1016/j.crhy.2013.09.014/

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