Abstract
The temperature dependence of the resistivity of thin Nb, Al, Be films has been studied over a wide temperature range 4-300 K. We have found that the temperature-dependent correction to the residual resistivity is well described by the sum of the Bloch-Grüneisen term and the term originating from the interference between electron-phonon and electron-impurity scattering. Study of the transport interference phenomena allows to determine electron-phonon coupling in disordered metals. The interference term is proportional to T2 and also to the residual resistivity and dominates over the Bloch-Grüneisen term at low temperatures (T<40 K).
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References
E.M. Gershenzon, M.E. Gershenzon, G.N. Gol'tsman et al., JETP 97 (1990) 901.
J. Bass, W.P. Pratt Rev. Mod. Phys. 62 (1990) 645.
P.M. Echternach, M.E. Gershenzon and H.M. Bozler, Phys. Rev. B 47 (1993) 13659.
M.Yu. Reizer and A.V. Sergeev, JETP, 92 (1987) 2291.
N.G. Ptitsina, G.M. Chulcova et al., JETP 80 (1995) 960.
N.W. Ashcroft and N.D. Mermin, Solid State Physics, Saunders, Philadelphia (1976).
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Chulcova, G.M., Ptitsina, N.G., Gershenzon, E.M. et al. Effect of the interference between electron-phonon and electron-impurity (boundary) scattering on resistivity Nb, Al, Be films. Czech J Phys 46 (Suppl 5), 2489–2490 (1996). https://doi.org/10.1007/BF02570231
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DOI: https://doi.org/10.1007/BF02570231