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Reversible charge storage in a single silicon atom

Amandine Bellec, Laurent Chaput, Gérald Dujardin, Damien Riedel, Louise Stauffer, and Philippe Sonnet
Phys. Rev. B 88, 241406(R) – Published 10 December 2013

Abstract

The ultimate miniaturization of electronic devices at the atomic scale with single electrons requires controlling the reversible charge storage in a single atom. However, reversible charge storage is difficult to control as usually only one charge state can be stabilized. Here, combining scanning tunneling microscopy (STM) and density functional theory (DFT), we demonstrate that a single silicon dangling bond of a hydrogenated p-type doped Si(100) surface has two stable charge states (neutral and negatively charged) at low temperature (5 K). Reversible charge storage is achieved using a gate electric field between the STM tip and the surface.

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  • Received 12 September 2013

DOI:https://doi.org/10.1103/PhysRevB.88.241406

©2013 American Physical Society

Authors & Affiliations

Amandine Bellec1,2, Laurent Chaput3,4, Gérald Dujardin1, Damien Riedel1,*, Louise Stauffer3, and Philippe Sonnet3

  • 1Institut des Sciences Moléculaires d’Orsay, ISMO, UMR 8214, CNRS, Université Paris Sud, 91405 Orsay Cedex, France
  • 2Laboratoire Matériaux et Phénomènes Quantiques, Université Paris Diderot Paris 7, Sorbonne Paris Cité, CNRS, UMR 7162, case courrier 7021, 75205 Paris cedex 13, France
  • 3Institut de Science des Matériaux de Mulhouse, IS2M, UMR 7361,CNRS, Université de Haute-Alsace, 3b rue A. Werner, 68093 Mulhouse, France
  • 4Institut Jean Lamour, UMR CNRS 7198, Nancy Université, Bd. des Aiguillettes, BP 23, 54506 Vandoeuvre Les Nancy Cedex, France

  • *Corresponding author: damien.riedel@u-psud.fr

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Issue

Vol. 88, Iss. 24 — 15 December 2013

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