Institution of Engineering and Technology

The IET is a world leading professional organisation sharing and advancing knowledge to promote science, engineering and technology across the world.

Effect of silicon nanowire etching on signal-to-noise ratio of SiNW FETs for (bio)sensor applications
Moh,T.S.Y. et al.
Electronics Letters(2013),49(13):782
http://dx.doi.org/10.1049/el.2013.1397

This article is available from multiple sources. Please click on the logo of the service to which you have a subscription, or click any logo to obtain pay-per-view access.

IET Digital Library on Scitation
  Access the IET Digital Library



IEL on IEEE Xplore
  Access the IEL (IEEE/IET Electronic Library) on IEEE Xplore®