Institution of Engineering and Technology

The IET is a world leading professional organisation sharing and advancing knowledge to promote science, engineering and technology across the world.

Atomic force microscopy tip–sample interaction analysis using nanocontact mechanic models
Daeinabi,K. et al.
Micro & Nano Letters(2011),6(9):794
http://dx.doi.org/10.1049/mnl.2011.0373

This article is available from multiple sources. Please click on the logo of the service to which you have a subscription, or click any logo to obtain pay-per-view access.

IET Digital Library on Scitation
  Access the IET Digital Library



IEL on IEEE Xplore
  Access the IEL (IEEE/IET Electronic Library) on IEEE Xplore®